DOI: 10.1063/5.0108226

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DOI: 10.1063/5.0108226

Paper Summary:

Title: [THE 8TH ANNUAL INTERNATIONAL SEMINAR ON TRENDS IN SCIENCE AND SCIENCE EDUCATION (AISTSSE) 2021(Medan, Indonesia ..-..)] THE 8TH ANNUAL INTERNATIONAL SEMINAR ON TRENDS IN SCIENCE AND SCIENCE EDUCATION (AISTSSE) 2021 || A comparative surface roughness study of silicon wafer by laser speckle technique, atomic force microscopy and stylus profilometry

Author(s): Prakasam, R. (author);Balamurugan, R. (author);Balasubramanian, S. (author)

Year: 2022

DOI: 10.1063/5.0108226

URL: https://doi.org/10.1063/5.0108226

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