Database DOI General ISSN ORCID Paper

DOI: 10.1109/ISSRE55969.2022.00026

Paper Summary:

Title: [2022 IEEE 33rd International Symposium on Software Reliability Engineering (ISSRE)(Charlotte, NC, USA 2022.10.31-2022.11.3)] 2022 IEEE 33rd International Symposium on Software Reliability Engineering (ISSRE) || Explainable AI for Android Malware Detection: Towards Understanding Why the Models Perform So Well?

Author(s): Liu, Yue (author);Tantithamthavorn, Chakkrit (author);Li, Li (author);Liu, Yepang (author)

Year: 2022

DOI: 10.1109/ISSRE55969.2022.00026

URL: https://doi.org/10.1109/ISSRE55969.2022.00026

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Database DOI General ISSN ORCID Paper