DOI: 10.1007/s12206-024-0740-6

Paper Summary:

Title: Automated visual inspection of particle defect in semiconductor packaging

Author(s): Park, Joonsub (author);Lee, Jeonghoon (author)

Year: 2024

DOI: 10.1007/s12206-024-0740-6

URL: https://doi.org/10.1007/s12206-024-0740-6

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2024-10-14, ∼793👍, 0💬

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