DOI: 10.1109/ICTBIG59752.2023.10456019

Paper Summary:

Title: [2023 IEEE International Conference on ICT in Business Industry & Government (ICTBIG)(Indore, India 2023.12.8-2023.12.9)] 2023 IEEE International Conference on ICT in Business Industry & Government (ICTBIG) || Machine Learning Algorithms for Detecting Fake Reviews – A Study

Author(s): Shanmugha Priya, R. K. (author);Murugeswari, K (author);Biju, J. (author);Libin Jacob, P. (author);Anbarasan, R. (author);B V, Santhosh Krishna (author)

Year: 2023

DOI: 10.1109/ICTBIG59752.2023.10456019

URL: https://doi.org/10.1109/ICTBIG59752.2023.10456019

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