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DOI: 10.1109/EDKCON62339.2024.10870857
Paper Summary:
Title: [2024 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)(Kolkata, India 2024.11.30-2024.12.1)] 2024 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON) || Enhanced Crop Yield Prediction by Machine Learning Techniques
Author(s): Das, Papiya (author);Pal, Abhranil (author);Mullick, Rakteem (author);Singha, Sayak (author);Nath, Subhrapratim (author)
Year: 2024
DOI: 10.1109/EDKCON62339.2024.10870857
URL: https://doi.org/10.1109/EDKCON62339.2024.10870857
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2025-05-05, ∼502👍, 0💬
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