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DOI: 10.1117/12.361037
Paper Summary:
Title: SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Terahertz Spectroscopy and Applications II -
Author(s): Arnone, Donald D.; Ciesla, Craig M.; Corchia, Alessandra; Egusa, S.; Pepper, Michael; Chamberlain, J. Martyn; Bezant, C.; Linfield, Edmund H.; Clothier, R.; Khammo, N.; Chamberlain, J. Martyn
Year: 1999
DOI: 10.1117/12.361037
URL: https://doi.org/10.1117/12.361037
Received on: 2024-05-21
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